Tescan introduce third generation SEM
The third generation of TESCAN microscopes represents nearly 20 years of experience gained from the research, development and manufacturing of scanning electron microscopes and supplementary accessories for SEMs and other special products. Within the current portfolio of TESCAN products there are the VEGA 3 scanning electron microscopes with tungsten and Lab6 filament options , MIRA 3 high resolution Schottky emitter scanning electron microscopes and the VELA and LYRA 3 focused ion beam scanning electron microscopes.
New, modern high-performance electronics allows faster acquiring and processing of high quality and high resolution images and thus decreasing time needed to obtain image. Unique TESCAN real time In-Flight Beam Tracing™ for the beam optimization is now available for both field emission and also thermal emission columns.