MeX - Turn any SEM into a measurement device

MeX is a stand alone software package that turns any SEM with digital imaging into a true surface metrology device. Using stereoscopic images the software automatically retrieves 3D information and presents a highly accurate, robust and dense 3D dataset which is then used to perform traceable metrology examination. The results are obtained irrespective of the SEM magnification providing metrology at macro and micro levels...

The software is self installing and is extremely easy to use. The modular design of the package allows flexibility in use; it also permits users, with a single repetitive task to perform, to purchase modules according to requirements. The analysis modules allow measurement of profile, roughness, area, volume and height. All measurements are traceable, can be calibrated and conform to ISO standards.

The performance of MeX has been proved by many customers in leading companies and universities throughout the world providing imaging and analysis previously unobtainable with SEM images.

Key Applications

Quantitative surface analysis with the SEM is often used to investigate damage evolution in materials in addition to assisting in the design of more fracture resistant materials.

The optimization of materials is complicated by the fact that the material properties may need to vary locally within the component. An example of this is cutting tools that need to be very hard at the cutting edge but be tough in the interior of the material. MeX is used to study deformation and fracture behaviour to optimize the performance of inhomogeneous materials. Dense, robust and accurate 3D reconstructions are created to allow measurement of fracture surface profiles, roughness parameters and fractal dimensions.

3D measurement results computed by MeX lead to significant understanding of parameters such as fracture toughness, crack growth and propagation or fracture resistance.

Courtesy O.Kolednik, Austrian Academy of Sciences, Leoben/Austria

Steel Production

Modern high-tech steel is one of today's most important materials in all kinds of industries, transportation or medicine. The surface characteristics can relate to appearance, conductivity, corrosion resistance, wear or many other properties. MeX is an essential tool to assist with surface characterization for quality assurance and failure analysis. The 3D measurement capabilities provide robust and accurate results on properties such as fracture and compression strength, notch bar impact value or creep strength.

MeX is also used to evaluate faults in steel production. The overall quality of steel is dependent on the topography of the roller used in its production. As soon as the roller exhibits any kind of surface defects the surface of the steel will show dimples and inclusions. Using the measurement capabilities of MeX these faults can be analysed and the source of the defect traced.

Forensic Studies

Every gun leaves distinctive marks and traces on the bullet cartridge and projectile, similar to fingerprints. These traces on a gun, found at a crime scene, can be instrumental to prove guilt of suspects. Conventional methods are based on the analysis of 2D images to identify which bullet has been fired from which weapon. However, the 3D visualization and measurement of the firing pin and cartridge indentation is far more precise. It is here that MeX offers unique capabilities providing a highly accurate, dense and robust 3D reconstruction with full depth of focus taken over a large field of view. Using MeX a user can, for example, measure the volume of a firing pin impression along with profile that can be related directly to the firing pin. This leads to a numerical evaluation independent from any subjective point of view, providing rapid and understandable analytical data for interpretation.

Crater Shape Measurement

MeX is used for the measurement of diameters, depths, angles of slope and volumes of craters created by impact of mineral grains on metals. This is part of the calibration work that has been done to help interpret cometary dust impacts on the stardust spacecraft, which returned to earth recently, carrying the first comet samples ever collected. MeX has been used as a measurement tool to interpret the size, density and composition of particles responsible for making micrometre-scale craters.

The ease of use of MeX, with its intuitive graphical interface, has enabled the quick and simple measurement of the required parameters. Data input and the range of easily interpreted reconstructions make MeX to a most suitable tool for quantified reconstruction of crater shapes from tilted stereo-pair electron micrographs.

Courtesy A. Kearsley, Natural History Museum, London/UK

Cancer Research in Life Science

MeX turns any SEM, in biological and non biological applications, into a full 3D measurement device. Until MeX, the biological user has had limited methods that could provide accurate and robust measurements of surface texture, volumes and area of bulky irregular samples.

In recent research MeX has been used to characterise the topography of the extracelluar matrix (ECM) underlying colon cancer cells at various stages.

Also, the enhanced visualization and roughness measurement capabilities of MeX have provided additional information, not previously available, about the cancers behaviour.

These findings have implications not only for improving the general understanding how colon cancer and metastasizes grow, but, also lead to a better understanding of the role of the ECM topography in cancer.

Courtesy R. Anderson, University of Illinois, Chicago/USA

Next step

For more information about how MeX may assist your electron microscopy analysis, please click here and have ISS contact you to arrange for literature, a demonstration or to answer any questions you may have.