X-ray microanalysis is an analytical technique for determination of the chemical composition of solid samples, thin layers or particles in electron microscopes. Using the QUANTAX energy dispersive X-ray spectrometry system (EDS) it is possible to detect and analyze all elements from beryllium (boron) to americium simultaneously. Obtaining elemental information from a sample volume of only a few microns and providing relative detection limits in the order of a tenth of mass percent makes X-ray microanalysis one of the most sensitive analysis methods available.
The QUANTAX family of EDS systems offered by Bruker AXS Microanalysis deliver reliable results across a broad range of applications with unprecedented speed, accuracy and ease of use.
The unique, liquid nitrogen free XFlash® silicon drift detectors (SDD) together with the state-of-the-art hybrid pulse processor technology deliver both the highest possible energy resolution and over ten times the speed of conventional Si(Li) based systems.
QUANTAX also features the powerful, new ESPRIT software with intuitive and easy-to-use interface. With true standardless analysis, proven standards based quantification, or even a combination of both methods, ESPRIT offers optimal tools for any application.
XFlash 5010 SDD
The Bruker XFlash 5010 gives excellent energy resolution (version with 123 eV at MnKα at 100,000 cps available) even at high count rates. The system is immediately usable after switching on and its small size and light weight make this an unintrusive and affordable addition to your anaylsis suite. A light element variant with Be detection is avaliable.
XFlash 5030 SDD
The highlight of the XFlash® 5030 Detector is that its SDD chip has an active area of 30 mm² housed in a detector finger no wider than that of the 10 mm² XFlash® 5010 Detector. This means it offers the same optimal geometric conditions as the XFlash® 5010 detector plus the added benefit of having three times the sensitive area and therefore covering three times the solid angle.
These properties make this detector the instrument of choice for low beam current / count rate conditions such as cold-cathode field emission SEMs, environmental SEMs or TEMs. Nevertheless, the XFlash® 5030 can easily cope with high input count rates up to 750,000 cps. (Resolution of resolution 133 eV at MnKα at 100,000 cps guaranteed, 127 eV and 129 eV available)
XFlash QUAD 5040 SDD
The QUAD provides a total active area of 40mm² which is divided into 4 separate channels of 10mm² each. The great advantage of this innovative design concept is that the detector maintains the high energy resolution of a single 10mm² SDD while offering 4 times the solid angle and throughput capability.
Combining the large active area with high energy resolution of down to <123 eV (at Mn Kα and 100,000 cps) makes the XFlash® QUAD highly efficient for elemental analyses even in low beam current situations, eg. in high resolution imaging mode or for the analysis of sensitive samples.
While maintaining excellent energy resolution, the XFlash® QUAD accepts up to 3,000,000 cps input count rate making this detector ideal for new analytical techniques, such as spectral imaging (PTS, HyperMap) as well as speeding up traditional EDS analysis. While most EDS systems offer this useful feature, it tends to be very time consuming when done with conventional Si(Li) based spectrometers. With the performance of the XFlash® QUAD it is now possible to use spectral imaging as the technique of choice for routine analysis.
XFlash 5030T SDD for TEM
The XFlash® 5030 T Detector is equipped with an SDD chip that has an active area of 30 mm². The slender detector finger offers optimal geometric conditions and enables a large solid angle for signal collection, as it allows the detector tip to be positioned close to the sample. The UHV-suitable design provides optimum conditions for interference-free operation. These properties make XFlash® 5030 T the perfect choice for use on transmission electron microscopes. The detector offers very good energy resolution (133 eV at MnKα at 100,000 cps guaranteed, 127 eV and 129 eV available)
Quantax CrystAlign
Bruker's QUANTAX CrystAlign EBSD analysis system provides the analyst with an easy to use yet fully functional tool for EBSD measurement and evaluation. The system can also be used in conjunction with the Quantax EDS system for simultaneous EBSD and EDS analysis.
Imperatives for the e–Flash EBSD detector’s design were speed, sensitivity, flexibility, reliability and high integration. The e–Flash is fully software controlled, positioning and setup can be done from the attached PC. Only a thin power supply and two signal cables are required to connect the detector.
The Quantax e-Flash offers in-situ vertically adjustable detector for maximum analytical flexibility, independent acquisition pattern streaming with 630 patterns/s (160 x 120 pixels), LED detector position indicator and multiple features for safe operation, a fully software controlled detector with integrated electronics, simultaneous EDS and EBSD acquisition with up to 100 patterns/s, re-indexing with up to 16,000 point/s, Signal Assistant for acquisition setup and a Calibration Assistant for geometrical setup.
Downloadable copies of the specifications for all of the Bruker SDD detectors are available in our Downloads section