For Special Developments in Microscopy
Expand the capabilities of your SEM, LM, AFM, ELSAM, etc.
30 years of experience have helped Kammrath & Weiss to convert your application requirements into useful products. This process has given rise to an entire family of unusual solutions for users worldwide.
High precision micro and nano systems have been carefully designed in great detail. The emphasis is on tomorrow's needs using modular design in state-of-the-art technology. This enables K&W's research tools to grow together with your increasing needs.
Are You Looking for the Solution to Your Application?
Many devices and instruments exist already, just waiting to be discovered by you. If you did not find an answer to your own requirements right away, K&W in association with ISS would be glad to sit down with you and listen to your needs. Then, using their unique engineering experiences, K&W will propose a solution to meet your requirements.
Cryo-Products
The ability to conduct cooling experiments inside the vacuum chamber of an SEM opens up many opportunities for physical (or biological) experiments. Liquid nitrogen cryostats (80K) and liquid helium cryostats (5K) with PID-temperature Controller are available with or without interface.
IC-Testing
Electrical testing of semiconductors combined with microscopy is one of the most critical factors in quality control and research. Kammrath & Weiss specialises in creating high precision test equipment:
Prober-modules for scanning electron microscopy, or FIB (Focused Ion Beam) - applications with 10nm positioning accuracy (measured directly at the tip). Systems with 1 to 6 prober tips available as standard with options for more probes (custom build). Prober-Modules are also for use with automatic airlock systems. They have extremely fast beam blanking times (<100 psec).
Materials Testing
Materials testing performed in conjunction with a light microscope is a well established extension to classical testing. K&W specialise in the design of testing instrumentation for these disciplines:
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Scanning Electron Microscopy (SEM).
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Atomic Force Microscopy (AFM).
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Focused Ion Beam Workstations (FIB).
Users may make microscopic in-situ observation while samples are put under tensile, compression, bending or torsional loads.
It is also possible to combine these tests with heating and/or cooling. And if your application requires more complexity, ask K&W for a quote. They specialise in custom instrumentation, a rarity in today's world of standard equipment.
Specimen Stages
While most microscope manufacturers make their own stages, there is always the need for new or custom solutions. This is the strength of Kammrath & Weiss - developing unique solutions.
K&W have already developed stages for various physical applications:
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Specimen stages for all fields of microscopy (including SEM, FIB, AFM)
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Specimen stages for laser microprobes
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Specimen stages for synchrotron work
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Specimen stages for heavy loads (50 kilograms)
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Diffraction devices
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Multiple custom designs